1. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
پدیدآورنده : \ Andrei Pavlov, Manoj Sachdev
کتابخانه: Library of Foreign Languages and Islamic Sources (Qom)
موضوع : Metal oxide semiconductors, Complementary -- Design. ,Random access memory.,نیمه هادی‌های اکسید فلزی مکمل -- طراحی ,حافظه دسترسی تصادفی
رده :
E-Book
,
2. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test
پدیدآورنده : / Andrei Pavlov, Manoj Sachdev
کتابخانه: Central Library of Campus 1 Technical University of Tehran (Tehran)
موضوع :
3. CMOS SRAM circuit design and parametric test in nano-scaled technologies
پدیدآورنده : / Andrei Pavlov, Manoj Sachdev
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Metal oxide semiconductors, Complementar--Design,Random access memory,Nanoelectronics
رده :
E-BOOK
4. Defect-Oriented Testing For Nano-Metric CMOS VLSI Circuits
پدیدآورنده : / by Manoj Sachdev, Jose Pineda de Gyvez
کتابخانه: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
موضوع : CMOS VLSI Circuits
رده :
TK7874
.
D47S2
2010
5. Defect Oriented Testing for CMOS Analog and Digital Circuits
پدیدآورنده : by Manoj Sachdev.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Computer engineering.,Engineering design.,Engineering.
6. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits, 2nd Edition
پدیدآورنده : / Manoj Sachdev, Jose Pineda de Gyvez
کتابخانه: Central Library of Campus 1 Technical University of Tehran (Tehran)
موضوع :
7. Defect oriented testing for nano metric CMOS vlsi circuits
پدیدآورنده : Sachdev, Manoj.
کتابخانه: Library of Razi Metallurgical Research Center (Tehran)
موضوع : ، Metal oxide semiconductors, Complementary- Testing,، Metal oxide semiconductors, Complementary- Defects
رده :
TK
7871
.
99
.
M44
S23
2007
8. #2000 IEEE International Workshop on Defect Based Testing
پدیدآورنده : #sponsored by IEEE Computer Society Test Technology Technical Committee , edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon
کتابخانه: Central Library of Esfehan University of Technology (Esfahan)
موضوع : Semiconductors- Defects- Congresses
رده :
#
QC
،#.
D4
,
I54
،#
2000
9. 2000 IEEE International Workshop on Defect Based Testing, April 30, 2000, Montreal, Canada
پدیدآورنده : sponsored by IEEE Computer Society Test Technology Technical Committee; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon
کتابخانه: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
موضوع : Testing -- Congresses ، Metal oxide semiconductors, Complementary,Congresses ، Iddq testing,Defects -- Congresses ، Integrated circuits
رده :
TK
7871
.
99
.
M44
2000
10. THERMAL AND POWER MANAGEMENT OF INTEGRATED CIRCULTS
پدیدآورنده : /Arman vassighi and Manoj sachdev
کتابخانه: National Library and Archives of Islamic Republic of Iran (Tehran)
موضوع :
11. Thermal and power management of integrated circuits
پدیدآورنده : / Arman Vassighi and Manoj Sachdev
کتابخانه: Central Library and Archive Center of shahid Beheshti University (Tehran)
موضوع : Integrated circuits,INTEGRATED CIRCUITS,THERMAL ENERGY,MANAGEMENT,CMOS,-- Management
رده :
621
.
3815
V339T
2006
